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W-CSP inspection probe card

W-CSP inspection probe card

Probe card for inspecting W-CSP (WLCSP) with balls implemented at the wafer level 【Features】 ○ User-friendly customization (including probe pins) ○ High maintainability ○ High durability performance accumulated by probe pins For more details, please contact us.

• Company：理化電子
• Price：Other

• Semiconductor inspection/test equipment
• Other semiconductors
• Printed Circuit Board